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Special Lectures
Tuesday, 24th November, 2020 14:25-14:50 JST
Plenary Session A
Dr. Kan AkatsuProfessor,Yokohama National University,Japan (Faculty of Engineering, Dept. of Mathematics, Physics, Electrical Engineering and Computer Science) |
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Kan Akatsu received B.S., M.S., and Ph. D degrees in electrical engineering from Yokohama National University, Yokohama, Japan, in 1995, 1997, 2000 respectively. “Current and Future Technologies of Electric Machines, VICS”Abstract: Many technologies of electric machines have been developed in recent years especially owing to the demand of high efficiency, high torque density, and higher power density for Electric Vehicle and so on. However, the torque density and the power density are approaching their limitation, further new technologies are expected. In this talk, I introduce some new technologies named as VICS that is a shorten word of technologies; Variable flux, Integration, Clustering, and Sensing. I will show you some research trend and results of these technologies with future prospect. |
Tuesday, 24th November,
2020 14:50-15:15 JST
Plenary Session B
Dr. Kyo-Beum LeeProfessor, Ajou University, Korea (Department of Electrical and Computer Engineering) |
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Kyo-Beum Lee received the B.S. and M.S. degrees in electrical and electronic engineering from the Ajou University, Suwon, Korea, in 1997 and 1999, respectively. He received the Ph.D. degree in electrical engineering from the Korea University, Seoul, Korea, in 2003. From 2003 to 2006, he was with the Institute of Energy Technology, Aalborg University, Aalborg, Denmark. From 2006 to 2007, he was with the Division of Electronics and Information Engineering, Jeonbuk National University, Jeonju, Korea. “Reliability of Power Conversion System”Abstract: This plenary speech introduces the reliability of the power conversion system. Research on the reliability of power conversion systems has been required from recent industries. The reliability of the power conversion system is related to the available lifetime of the system, and many studies have been conducted to improve the lifetime of the system. The failures of power semiconductor devices and capacitors account for more than half of the power conversion system failure causes. Therefore, this speech explains the failure causes and failure modes of the insulated gate bipolar transistor (IGBT), which is one of the most common power semiconductor devices in power conversion systems. In addition, the failure cause and failure mode of the capacitor are presented and the study for improving the lifetime of the DC-link capacitor is briefly introduced. |
Tuesday, 24th November,
2020 15:15-15:40 JST
Plenary Session C
Dr. Yaohua LiDirector, Professor, Institute of Electrical Engineering, Chinese Academy of Sciences (CAS), China |
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Yaohua Li was born in Henan, China, in 1966. He received the Ph.D. degree in power electronics and electric drives from Tsinghua University, Beijing, China, in 1994. From 1995 to 1997, he was a Postdoctoral Research Fellow with the Institute of Electrical Machine, Technical University of Berlin, Germany. In 1997, he joined the Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China, where he is currently a Professor and Director of this institute. His research interests include analysis and control of electrical machines, power electronics, etc. “Research and Development of Advanced Electromagnetic Technology in IEE, CAS”Abstract: The Institute of Electrical Engineering (IEE) is a key research institute of Chinese Academy of Sciences (CAS). It is mainly engaged in the research of advanced electromagnetic technologies including electric power generation, transmission and distribution, and efficient utilization. This report first gives a brief overview of IEE,CAS, and then introduces the research and development progress on renewable energy power generation, cooling of large capacity electrical machines, applied superconductivity, power electronic and electrical drives, wireless power transmission, bio-electromagnetics of IEE,CAS in recent years, and finally presents the prospect of future development of IEE,CAS.. |