ITEAM Network Coordinator
Automotive Engineering Group
Technische Universität Ilmenau
Challenges of Integrated Vehicle Chassis Control: Some Findings of The European Project EVE
Valentin Ivanov received the Ph.D. degree in 1997 and the D.Sc. degree in 2006 in Automotive Engineering from Belarusian National Technical University in Minsk, where he worked successively as Assistant, Associated and Full Professor. In 2007, as a Research Professor, he became an Alexander von Humboldt Fellow and in 2008 a Marie Curie Fellow with Technische Universität Ilmenau, Germany. Currently he is working at TU Ilmenau with the Automotive Engineering Group as the coordinator of several European industrial-academic projects. Valentin Ivanov is IEEE senior member, member of Society of Automotive Engineers of Japan and the Association of German Engineers. He is a recipient of SAE Ralph R. Teetor Educational Award (USA) and CADLM Intelligent Optimal Design Prize. His research fields are vehicle dynamics, electric vehicles, and automotive control systems.
Development of information technologies and mechatronic systems as well as an increased demand on environment-acceptable and safe intelligent technologies has a profound impact on vehicle engineering. This impact results in both an increasing degree of automation of systems employed in vehicles and emerging new concepts like integrated chassis control. To contribute to this topic, a consortium of several industrial and academic partners from EU, South Africa and USA has performed consolidated research and innovation actions for development of new integrated chassis control technologies within the framework of the project EVE - /*Innovative Engineering of Ground Vehicles with Integrated Active Chassis Systems*/. The presented talk will introduce the main EVE outcomes concentrated around integration of active brake, suspension and tyre pressure control. A particular attention will be given to the problems of vehicle and tyre modelling, state estimation, robust chassis control, and experimental validation tools.
System Integration and Control of Mechatronic Imaging Systems
Georg Schitter received a M.Sc. from Graz University of Technology, Austria, and a M.Sc. and a Ph.D. from ETH Zurich, Switzerland. He was a postdoctoral fellow at UCSB (Santa Barbara, CA), and an Associate Professor at Delft University of Technology, the Netherlands. Currently he is a full Professor at Vienna University of Technology in the Department of Electrical Engineering. He was a recipient of several prestigious fellowships and awards, among them the 2013 Young Researcher Award of the IFAC TC Mechatronics, the best paper award from the Asian Journal of Control (2004-2005) and from the IFAC Journal Mechatronics (2008-2011). He served as an Associate Editor for the IEEE CEB, the IFAC Journal Control Engineering Practice, the IFAC Journal Mechatronics, and for the IEEE/ASME Transactions on Mechatronics. His primary research interests are on high-performance mechatronic systems and multidisciplinary system integration, particularly for precision engineering applications in the high-tech industry, scientific instrumentation, and mechatronic imaging systems.
Mechatronic imaging systems, such as atomic force microscopes (AFM), wafer scanners, adaptive optics, and scanning laser metrology and microscopy, demand a continuous improvement of system speed, range, and precision, which requires advanced mechatronic designs and highly sophisticated motion control. A proper system integration fostering the interplay between process design and control design is key for the development and engineering of mechatronic systems in the high-tech industry. Already at the system design phase all components involved in the specific application have to be considered, where a well predictable behaviour of all system components is required. Examples for these components are the mechanical structure of the device, the power amplifier, the actuators, the sensors, electronics, and the real-time control system. To meet the demanding specifications, the final system, including all hard- and software components, has to be tailored to and optimized for each specific application. This presentation addresses these challenges by illustrating examples for precision motion control, AFM imaging, confocal laser scanning microscopy, telescope systems and adaptive optics, as well as scanning laser metrology. The presented examples successfully demonstrate the potential to enhance the performance of mechatronic imaging systems via an integrated mechatronic design approach by utilizing the interplay between process design and control design.